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package com.jcdm.main.da.testDeviceInterface.service.impl; |
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import java.util.List; |
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import com.baomidou.mybatisplus.extension.service.impl.ServiceImpl; |
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import com.jcdm.common.utils.DateUtils; |
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import com.jcdm.main.da.passingStationCollection.domain.DaPassingStationCollection; |
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import com.jcdm.main.da.passingStationCollection.mapper.DaPassingStationCollectionMapper; |
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import org.springframework.beans.factory.annotation.Autowired; |
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import org.springframework.stereotype.Service; |
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import com.jcdm.main.da.testDeviceInterface.mapper.DaTestDeviceInterfaceMapper; |
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import com.jcdm.main.da.testDeviceInterface.domain.DaTestDeviceInterface; |
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import com.jcdm.main.da.testDeviceInterface.service.IDaTestDeviceInterfaceService; |
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/** |
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* 测试设备接口数据Service业务层处理 |
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* |
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* @author hdy |
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* @date 2024-05-13 |
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*/ |
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@Service |
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public class DaTestDeviceInterfaceServiceImpl extends ServiceImpl<DaTestDeviceInterfaceMapper, DaTestDeviceInterface> implements IDaTestDeviceInterfaceService |
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{ |
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@Autowired |
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private DaTestDeviceInterfaceMapper daTestDeviceInterfaceMapper; |
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/** |
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* 查询测试设备接口数据 |
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* |
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* @param id 测试设备接口数据主键 |
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* @return 测试设备接口数据 |
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*/ |
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@Override |
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public DaTestDeviceInterface selectDaTestDeviceInterfaceById(Long id) |
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{ |
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return daTestDeviceInterfaceMapper.selectDaTestDeviceInterfaceById(id); |
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} |
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/** |
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* 查询测试设备接口数据列表 |
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* |
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* @param daTestDeviceInterface 测试设备接口数据 |
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* @return 测试设备接口数据 |
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*/ |
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@Override |
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public List<DaTestDeviceInterface> selectDaTestDeviceInterfaceList(DaTestDeviceInterface daTestDeviceInterface) |
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{ |
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return daTestDeviceInterfaceMapper.selectDaTestDeviceInterfaceList(daTestDeviceInterface); |
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} |
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/** |
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* 新增测试设备接口数据 |
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* |
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* @param daTestDeviceInterface 测试设备接口数据 |
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* @return 结果 |
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*/ |
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@Override |
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public int insertDaTestDeviceInterface(DaTestDeviceInterface daTestDeviceInterface) |
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{ |
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daTestDeviceInterface.setCreateTime(DateUtils.getNowDate()); |
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return daTestDeviceInterfaceMapper.insertDaTestDeviceInterface(daTestDeviceInterface); |
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} |
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/** |
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* 修改测试设备接口数据 |
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* |
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* @param daTestDeviceInterface 测试设备接口数据 |
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* @return 结果 |
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*/ |
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@Override |
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public int updateDaTestDeviceInterface(DaTestDeviceInterface daTestDeviceInterface) |
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{ |
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daTestDeviceInterface.setUpdateTime(DateUtils.getNowDate()); |
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return daTestDeviceInterfaceMapper.updateDaTestDeviceInterface(daTestDeviceInterface); |
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} |
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/** |
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* 批量删除测试设备接口数据 |
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* |
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* @param ids 需要删除的测试设备接口数据主键 |
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* @return 结果 |
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*/ |
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@Override |
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public int deleteDaTestDeviceInterfaceByIds(Long[] ids) |
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{ |
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return daTestDeviceInterfaceMapper.deleteDaTestDeviceInterfaceByIds(ids); |
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} |
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/** |
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* 删除测试设备接口数据信息 |
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* |
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* @param id 测试设备接口数据主键 |
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* @return 结果 |
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*/ |
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@Override |
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public int deleteDaTestDeviceInterfaceById(Long id) |
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{ |
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return daTestDeviceInterfaceMapper.deleteDaTestDeviceInterfaceById(id); |
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} |
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} |